The Em-Tec multiple stub holders are an economical and pragmatic way to load multiple Hitachi sample stubs with specimens in the SEM. Using multiple stub holders saves time, allows multi sample processing or allows for quickly comparing samples against each other. The following types are offered:
The horizontal multi stub holders are based on the Ø25 x 6mm x M4 and the Ø50mm x 6mm x M4 Hitachi stubs to hold multiple stubs on M4 screws. The 45° multiple holders allow for a 45° pre-tilt which is beneficial for table top SEMs w/o a stage tilt or to quickly image under 45° w/o having to tilt the SEM stage. 45° tilted imaging tends to give a higher SE signal and reveals more of the topography of the specimen surface. The EM-Tec 45° multi stub holders are offered in two versions:
Product # |
Type |
No. of stubs |
Type |
Dimensions w/o pin |
Stub type |
SEM stage compatible |
H3 |
3 x Ø15 |
Horizontal |
Ø25x6mm |
M4 thread |
Standard 3.2mm pin |
|
H3 |
3 x Ø15 |
Horizontal |
Ø25x6mm |
M4 thread |
M4 thread |
|
H3L |
3 x Ø25 |
Horizontal |
Ø50x6mm |
M4 thread |
Standard 3.2mm pin |
|
H3L |
3 x Ø25 |
Horizontal |
Ø50x6mm |
M4 thread |
M4 thread |
|
H6 |
6 x Ø15 |
Horizontal |
Ø50x6mm |
M4 thread |
Standard 3.2mm pin |
|
H6 |
6 x Ø15 |
Horizontal |
Ø50x6mm |
M4 thread |
M4 thread |
|
H3/45 |
3 x Ø15 |
45 degrees |
Ø25x14mm |
M4 thread |
Standard 3.2mm pin |
|
H3/45 |
3 x Ø15 |
45 degrees |
Ø25x14mm |
M4 thread |
M4 thread |
|
H3/45R |
3 x Ø15 |
45 degrees |
Ø25x14mm |
M4 thread rot. |
Standard 3.2mm pin |
|
H3/45R |
3 x Ø15 |
45 degrees |
Ø25x14mm |
M4 thread rot. |
M4 thread |
|
H6/45 |
6 x Ø15 |
45 degrees |
Ø35x14mm |
M4 thread |
Standard 3.2mm pin |
|
H6/45 |
6 x Ø15 |
45 degrees |
Ø35x14mm |
M4 thread |
M4 thread |
|
H6/45R |
6 x Ø15 |
45 degrees |
Ø35x14mm |
M4 thread rot. |
Standard 3.2mm pin |
|
H6/45R |
6 x Ø15 |
45 degrees |
Ø35x14mm |
M4 thread rot. |
M4 thread |
Ordering Information for EM-Tec multiple Hitachi stub holders for SEMs using pin stubs; TFS, FEI, Philips, Zeiss, LEO Tescan, AmRay, Pemtron, Coxem, Aspex, RJLee, Cambridge Instruments, Leica, and CamScan
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